skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.


Search for: All records

Creators/Authors contains: "Di Fratta, Giovanni"

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. This article offers various mathematical contributions to the behavior of thin films. The common thread is to view thin film behavior as the variational limit of a three-dimensional domain with a related behavior when the thickness of that domain vanishes. After a short review in Section 1 of the various regimes that can arise when such an asymptotic process is performed in the classical elastic case, giving rise to various well-known models in plate theory (membrane, bending, Von Karmann, etc…), the other sections address various extensions of those initial results. Section 2 adds brittleness and delamination and investigates the brittle membrane regime. Sections 4 and 5 focus on micromagnetics, rather than elasticity, this once again in the membrane regime and discuss magnetic skyrmions and domain walls, respectively. Finally, Section 3 revisits the classical setting in a non-Euclidean setting induced by the presence of a pre-strain in the model. 
    more » « less
  2. null (Ed.)